User:Edo248/Books/Microelectronics


Microelectronics

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Digital Design, Fabrication, and more

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Electronic design automation
Algorithm engineering
Algorithmic State Machine
And-inverter graph
Antenna effect
Asynchronous system
Black's equation
Boolean satisfiability problem
Cell (EDA)
Channel router
Circuit extraction
Design closure
Design flow (EDA)
Design for manufacturability (IC)
Design for testing
Digital electronics
Dolphin Integration
EDA database
Electromagnetic field solver
Electromigration
Electronic circuit simulation
Electronic system-level design and verification
Elmore delay
Engineering Change Order
Fault coverage
Feedback controlled electromigration
Fiduccia-Mattheyses algorithm
Floorplan (microelectronics)
Gajski-Kuhn chart
Generic array logic
Graphical system design
Hardware obfuscation
High-level synthesis
High-level verification
IC layout editor
IEC 61131-3
Input/output Buffer Information Specification
Ladder logic
Lee algorithm
Logic optimization
Logic simulation
Logic synthesis
Mask data preparation
Maze runner
Multi-channel length
Multi-project wafer service
Netlist
Network On Chip
Noise margin
Open Verification Methodology
PBIST
Physical design (electronics)
Place and route
Placement (EDA)
Platform-based design
Potential applications of carbon nanotubes
Power gating
Power network design (IC)
Power optimization (EDA)
Programmable Array Logic
Programmable logic array
Programmable system device
Register-transfer level
Rent's rule
Resolution enhancement technologies
Routing (electronic design automation)
Satisfiability Modulo Theories
SCALD
Schematic
Schematic capture
Schematic editor
Semiconductor device modeling
Semiconductor intellectual property core
Semiconductor process simulation
Signal integrity
Signoff (electronic design automation)
Silicon compiler
Simulation software
Standard cell
State logic
Stuck-at fault
Substrate coupling
Symbolic simulation
Systems design
Technology CAD
Test compression
Touchstone file
Transaction-level modeling
Ultra-large-scale systems
Universal Verification Methodology
Integrated circuit
Invention of the integrated circuit
List of integrated circuit manufacturers
4000 series
List of 7400 series integrated circuits
7400 series
74181
8250 UART
AMD Lance Am7990
Angle-sensitive pixel
ANTIC
Application-specific instruction-set processor
Application-specific integrated circuit
Application-specific standard product
Atari AMY
AY-3-8500
Beetle (ASIC)
Built-in self-test
Cactus graph
Charge controller
Charge-coupled device
Chip art
Chip famine
Chip support package
Chipset
CMD640
CMOS
Compliant bonding
Computer module
Copper interconnect
CTIA and GTIA
Current conveyor
Delay-locked loop
Die (integrated circuit)
Die shrink
Digital clock manager
Digital signal controller
Digital signal processor
Disk controller
Engineering sample
EPROM
Floppy disk controller
Fluorosilicate glass
Full custom
Fully differential amplifier
General Purpose Input/Output
Gold-aluminium intermetallic
HCMOS
Heat generation in integrated circuits
High Precision Event Timer
Hot-carrier injection
IC power supply pin
Iddq testing
Integrated circuit design
Integrated circuit development
Integrated circuit layout design protection
Integrated fluidic circuit
Intel 8237
Intel 8251
Intel 8253
Intel 8255
Intel 8259
Intel 8279
Intel MCS-48
Interconnect bottleneck
Interface Logic Model
Interposer
Inverter (logic gate)
Irreversible circuit
Latchup
List of 4000 series integrated circuits
Logic built-in self-test
Magic (software)
MAX232
Mead & Conway revolution
Melexis
Memory Management Controller
Microtune MT2060
Moisture Sensitivity Level
Monolithic microwave integrated circuit
MOS Technology CIA
MOS Technology SID
MOS Technology VIC
MOS Technology VIC-II
MOSIS
Motorola 68881
NCR 5380
NCR 53C9x
NE2000
Network Search Engine
Neurochip
Operational amplifier
Optical interconnect
PCMOS
Bob Pease
Peripheral DMA controller
PHY (chip)
Pin-compatibility
PLL multibit
POKEY
Power Management IC
PowerHUB
Process control monitoring
Process corners
Programmer (hardware)
PSoC
P–n junction isolation
Quality Intellectual Property Metric
Quality of results
Radiation hardening
Real-time clock
Repeater insertion
Resistor–transistor logic
RFIC
Semiconductor Chip Protection Act of 1984
Semiconductor memory
Silicon-germanium
Special Input/Output
System in package
System-level solution
Thermal simulations for Integrated Circuits
Three-dimensional integrated circuit
Through-silicon via
Timing delay in vlsi circuit
TMS6100
Transistor count
Transmission-line pulse
16550 UART
VerilogCSP
Very-large-scale integration
VHSIC
VLSI Project
Western Digital FD1771
Jim Williams (analog designer)
Xceive XC3028
Zilog SCC
Semiconductor device fabrication
Advanced Silicon Etch
Airgap (microelectronics)
B-staging
Back end of line
Ball bonding
Beam lead technology
Bond characterization
Borophosphosilicate glass
Bow and warp of semiconductor wafers and substrates
Capacitance voltage profiling
Chalcogenide chemical vapour deposition
Channel-stopper
Chemical vapor deposition
Chemical-mechanical planarization
Alfred Y. Cho
Cleanroom
Common Platform
Dark current spectroscopy
Deal–Grove model
Deep reactive-ion etching
Device under test
Dicing tape
Die preparation
Diffusion barrier
Doping (semiconductor)
Drive Level Capacitance Profiling
Dry etching
Electron beam-induced current
Electrostatic spray assisted vapour deposition
Epitaxy
Epiwafer
Etching (microfabrication)
EV Group
Evaporation (deposition)
Fabless manufacturing
Front end of line
Finetech
Focused ion beam
FOUP
Furnace anneal
Gas immersion laser doping
Gate count
Hardmask
Health hazards in semiconductor manufacturing occupations
Homotopotaxy
High-Speed SECS Message Services
Hydride vapour phase epitaxy
Integrated circuit packaging
Integrated device manufacturer
Ion beam
Ion beam lithography
Ion beam mixing
Ion implantation
Ion Layer Gas Reaction
Kinetic Monte Carlo surface growth method
Klaiber's law
Laser trimming
Layer (electronics)
Lift-off (microtechnology)
List of semiconductor fabrication plants
Metal-induced crystallization
Metalorganic vapour phase epitaxy
Microfabrication
Micropipe
Monolayer doping
Negative bias temperature instability
Non-contact wafer testing
Ohmic contact
Oramir
Overlay Control
Package on package
Phenol formaldehyde resin
Phosphosilicate glass
Physical vapor deposition
Planar process
Plasma ashing
Plasma cleaning
Plasma etcher
Plasma etching
Plasma-enhanced chemical vapor deposition
Plasma-immersion ion implantation
Polycide
Probe card
Process design kit
Process variation (semiconductor)
Product binning
Product engineering
PROLITH
Pulsed laser deposition
Rapid thermal processing
RCA clean
Reactive-ion etching
Redistribution layer
Reliability (semiconductor)
Resist
Restrictive design rules
Rigid needle adapter
Salicide
SECS/GEM
Selective area epitaxy
Semiconductor Equipment and Materials International
Semiconductor fabrication plant
Semiconductor industry
Shallow trench isolation
Silicon intellectual property
Silicon on sapphire
Smart Cut
Smif interface
Spin coating
Spreading Resistance Profiling
Sputter deposition
Strained silicon directly on insulator
Stress migration
Substrate mapping
Tetrakis(dimethylamido)titanium
Thermosonic bonding
Titanium nitride
Triethylgallium
Trimethylgallium
Ultra-high-purity steam for oxidation and annealing
Vapour phase decomposition
Wafer (electronics)
Wafer backgrinding
Wafer dicing
Wafer fabrication
Wafer testing
Wafer-scale integration
Wafering
Wire bonding
Integrated circuit layout
Foundry model
Altis Semiconductor
GlobalFoundries
Hejian Technology Corporation
Hindustan Semiconductor Manufacturing Company
Jazz Semiconductor
Powerchip Semiconductor
Semiconductor Manufacturing International Corporation
Systems on Silicon Manufacturing Co. Pte. Ltd.
Tower Semiconductor
TSMC
United Microelectronics Corporation
Vanguard International Semiconductor Corporation
X-Fab