Talk:Built-in self-test

Would not this article be linked or merge in a more general manner with the On-Board Diagnostics used in the automobile section. Thanks

Diphda

Shouldn't there be some mention of POST (Power-on Self-test) and link to that article?

Yes, POST, Initiated BIT, and Continuous BIT should be added as part of BIT, and BIST should be a subset of BIT.

I rule !

Marian Marinescu

The reference hinted at by the redlink is to the following paper:

• Marinescu, M., 1982. Simple and Efficient Algorithms for Functional RAM Testing. 1982 IEEE Test Conference, Philadelphia, (Nov.). IEEE Computer Society, pp. 236-239.

DFH 14:13, 4 January 2007 (UTC)

Is this appropriate in here, it's not really related to BIST. The whole article seems a bit confusing, as one user pointed out, it doesn't classify and identify differences from POST, BIT (Built-In-Test) and BIST. The techniques at the top to me are BIT, then it mentions one type of BIST, Logic BIST which uses PRPG and MISRs (quoted in article differently as CRC). That is for LogicBIST only in silicon. MemoryBIST, many times is referred to as ArrayBIST (memory array). This PBIST article is a bit of marketing from Intel if you ask me. PBIST is just memory/ArrayBIST which is one paragraph, not showing any of hte techniques. The PDF is focused on failure analysis, so I think in the wrong place. Anyone else agree? Further silicon is not just tested with Pseudo-random patterns but there is deterministic BIST as well offered by well known companies. PCB BIST is yet another deterministic (random patterns don't work) BIST when done through scan (IEEE 1149.1 based). I seperate out functional/software BIT approaches from 'structural test' approaches - meaning the functionality is hidden in BIST. The technique is heavlily using scan flip-flops in LogicBIST and PCB BIST compared to BIT which is actually using the functionality of the target such as the processor and memory. Anyone else on the same page? Thanks. Jtagchair (talk) 03:45, 1 September 2009 (UTC)

Requesting redirect

Would someone please create a redirect from Built-in test to this page? — Preceding unsigned comment added by 70.247.162.84 (talk) 18:34, 14 September 2012 (UTC)

"Naming" section

Shouldn't this section be removed?! Nothing in it explains the naming. JChMathae (talk) 15:30, 11 January 2023 (UTC)

The material is uncited and difficult to understand. I have moved it here in case anyone wants to work on it. ~Kvng (talk) 21:42, 15 January 2023 (UTC)

The BIST name and concept originated with the idea of including a pseudorandom number generator (PRNG) and cyclic redundancy check (CRC) on the IC. If all the registers that hold state in an IC are on one or more internal scan chains, then the function of the registers and the combinational logic between them will generate a unique CRC signature over a large enough sample of random inputs. So all an IC needs to do is store the expected CRC signature and test for it after a large enough sample set from the PRNG. The CRC comparison with expected signature or the actual resultant CRC signature is typically accessed via the JTAG IEEE 1149.1 standard.