Grazing incidence diffraction (GID) is a technique for interrogating a material using small incidence angles for an incoming wave, often leading to the diffraction being surface sensitive. It occurs in many different areas:
- Reflection high-energy electron diffraction (RHEED), where electrons of relatively high energy diffract at small angles from a surface. RHEED is used to interrogate surface structure.[1][2]
- Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure.[3]
- X-ray standing waves, another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry.[4]
- Grazing-incidence small-angle scattering (GISAS) a hybrid approach using small scattering (diffraction) angles with X-rays or neutrons.[5]
- X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured.[6][7][8]
- Grazing incidence atom scattering,[9][10] where the fact that atoms (and ions) can also be waves is used to diffract from surfaces.
- Quantum reflection, where very low kinetic energy atoms or molecules are diffracted (reflected) from surfaces.[11]
- Evanescent waves, which occur with all of the above and also photons where there is no flow of energy into the material.
![](http://up.wiki.x.io/wikipedia/commons/thumb/e/ed/Grazing_incidence_diffraction_GIXD.png/220px-Grazing_incidence_diffraction_GIXD.png)
More details and citations on these can be found in the links provided above.
See also
editReferences
edit- ^ Ichimiya, Ayahiko; Cohen, Philip (2004). Reflection high-energy electron diffraction. Cambridge, U.K.: Cambridge University Press. ISBN 0-521-45373-9. OCLC 54529276.
- ^ Braun, Wolfgang (1999). Applied RHEED : reflection high-energy electron diffraction during crystal growth. Berlin: Springer. ISBN 3-540-65199-3. OCLC 40857022.
- ^ Feidenhans'l, R. (1989). "Surface structure determination by X-ray diffraction". Surface Science Reports. 10 (3). Elsevier BV: 105–188. doi:10.1016/0167-5729(89)90002-2. ISSN 0167-5729.
- ^ B. W. Batterman and H. Cole (1964). "Dynamical Diffraction of X Rays by Perfect Crystals". Reviews of Modern Physics. 36 (3): 681. doi:10.1103/RevModPhys.36.681.
- ^ Levine, J. R.; Cohen, J. B.; Chung, Y. W.; Georgopoulos, P. (1989-12-01). "Grazing-incidence small-angle X-ray scattering: new tool for studying thin film growth". Journal of Applied Crystallography. 22 (6). International Union of Crystallography (IUCr): 528–532. doi:10.1107/s002188988900717x. ISSN 0021-8898.
- ^ J. Als-Nielsen, D. McMorrow, Elements of Modern X-Ray Physics, Wiley, New York, (2001).
- ^ J. Daillant, A. Gibaud, X-Ray and Neutron Reflectivity: Principles and Applications. Springer, (1999).
- ^ M. Tolan, X-Ray Scattering from Soft-Matter Thin Films, Springer, (1999).
- ^ Khemliche, H.; Rousseau, P.; Roncin, P.; Etgens, V. H.; Finocchi, F. (2009). "Grazing incidence fast atom diffraction: An innovative approach to surface structure analysis". Applied Physics Letters. 95 (15): 151901. doi:10.1063/1.3246162. ISSN 0003-6951.
- ^ Bundaleski, N.; Khemliche, H.; Soulisse, P.; Roncin, P. (2008). "Grazing Incidence Diffraction of keV Helium Atoms on a Ag(110) Surface". Physical Review Letters. 101 (17). doi:10.1103/physrevlett.101.177601. ISSN 0031-9007.
- ^ Shimizu, Fujio (2001). "Specular Reflection of Very Slow Metastable Neon Atoms from a Solid Surface". Physical Review Letters. 86 (6): 987–990. doi:10.1103/PhysRevLett.86.987. ISSN 0031-9007.