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Summary
| Description |
Title: SIMS - Secondary Ion Mass Spectrometry, instrument scheme
|
| Date | 6 February 2006 (original upload date) |
| Source | No machine-readable source provided. Own work assumed (based on copyright claims). |
| Author | No machine-readable author provided. Twisp assumed (based on copyright claims). |
Summary
- Cesium ion source
- Duoplasmatron
- Electrostatic lens
- Sample
- Electrostatic sector - ion energy analyser
- Electromagnet - mass analyser
- Electron multiplier / Faraday cup
- Channel-plate / Fluorescent screen - ion image detector
Licensing
|
I, the copyright holder of this work, release this work into the public domain. This applies worldwide. In some countries this may not be legally possible; if so: I grant anyone the right to use this work for any purpose, without any conditions, unless such conditions are required by law. |
File history
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 20:13, 24 July 2015 | | 600 × 600 (64 KB) | Cmdrjameson | Compressed with pngout. Reduced by 23kB (26% decrease). |
| 17:49, 6 February 2006 |  | 600 × 600 (87 KB) | Twisp | * Title: SIMS - Secondary Ion Mass Spectrometry, instrument scheme * Author: Twisp * Date: 06.02.2006 |
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