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current | 04:14, 26 March 2015 | 880 × 1,570 (547 KB) | Materialscientist | {{Information |Description= Atomic resolved STEM–ADF images to reveal the distribution of different point defects. (a) Antisite defects in PVD MoS2 monolayers. Scale bar, 1 nm. (b) Vacancies including VS and VS2 observed in ME monolayers, similar to... |
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