DescriptionGraph of resistance of LK-99 - xray diffraction.jpg
English: Reported graph of resistance measured across a small flake of LK-99, as reported by a researcher at Southeast University, China. From a still of a screen shown on a livestream. No associated paper or technical report was published. The apparent artefact in measurement between 230K and 250K was not explained. Noise dominates measurements below 10 µΩ, which is well above the 0.1 µΩ measured in standard superconductivity experiments. (Example from a high-T superconducting film)
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