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Summary
| Description | Electron diffraction pattern (red) of a polycrystalline Al film, with an fcc spiral overlay (green) to facilitate search for a line of intersections (blue) which confirms the fcc nature and provides a measure of the cubic lattice parameter as well. See also P. Fraundorf and Shuhan Lin (2004) "Spiral powder overlays", Microscopy and Microanalysis 10:S2, 1356-1357 and the January 2005 Microscopy Today 13: 8-11. |
| Date | |
| Source | Own work |
| Author | P. Fraundorf |
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Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License. |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 15:02, 24 February 2008 | | 512 × 488 (178 KB) | Unitsphere | {{Information |Description=Electron diffraction pattern (red) of a polycrystalline Al film, with an fcc spiral overlay (green) to facilitate search for a line of intersections (blue) which confirms the fcc nature and provides a measure of the cubic lattic |
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